On the fly formatting

ABSTRACT

The disclosure is related to systems and methods of On the Fly Formatting. Various parameters that influence areal density of hard disc regions can be changed on the fly based on storage capacity and reliability needs. Further adjustments can be made to the formatting of the region to fine tune achievable storage capacity and reliability values. In some cases, the formatting can include error correction code strength, gap widths between user data sectors and servo data sectors, other characteristics or parameters, or any combinations thereof.

CROSS-REFERENCE TO RELATED APPLICATION

The present application is a continuation of and claims priority to U.S.patent application Ser. No. 14/611,120 filed on Jan. 30, 2015, entitled“ON THE FLY FORMATTING”, the contents of which is hereby incorporated byreference in its entirety.

SUMMARY

In some embodiments, a data storage device can include a magnetic datastorage medium, and a circuit configured to modify, in real-time, anareal density of a region of the magnetic data storage medium based onone or more characteristics of the data storage device.

In some embodiments, a method can include formatting a region of themagnetic data storage medium based on one or more characteristics of thedata storage device.

In some embodiments, an apparatus can include a circuit configured tomodify, in real-time, an areal density of a region of a magnetic datastorage medium based on a reliability value.

BRIEF DESCRIPTION OF THE DRAWINGS

FIG. 1 is a diagram of a system of On the Fly Formatting, in accordancewith certain embodiments of the present disclosure;

FIG. 2 is a diagram of a system of On the Fly Formatting, in accordancewith certain embodiments of the present disclosure;

FIG. 3 is a diagram of a system of On the Fly Formatting, in accordancewith certain embodiments of the present disclosure;

FIG. 4 is a flowchart of a method for On the Fly Formatting, inaccordance with certain embodiments of the present disclosure;

FIG. 5 is a flowchart of a method for On the Fly Formatting, inaccordance with certain embodiments of the present disclosure;

FIG. 6 is a flowchart of a method for On the Fly Formatting, inaccordance with certain embodiments of the present disclosure;

FIG. 7 is a flowchart of a method for On the Fly Formatting, inaccordance with certain embodiments of the present disclosure; and

FIG. 8 is a flowchart of a method for On the Fly Formatting, inaccordance with certain embodiments of the present disclosure.

DETAILED DESCRIPTION

In the following detailed description of the embodiments, reference ismade to the accompanying drawings which form a part hereof, and in whichare shown by way of illustrations. It is to be understood that featuresof the various described embodiments may be combined, other embodimentsmay be utilized, and structural changes may be made without departingfrom the scope of the present disclosure. It is also to be understoodthat features of the various embodiments and examples herein can becombined, exchanged, or removed without departing from the scope of thepresent disclosure.

In accordance with various embodiments, the methods and functionsdescribed herein may be implemented as one or more software programsrunning on a computer processor, controller, or a data storage device,such as hard disc drive or hybrid drive. Dedicated hardwareimplementations including, but not limited to, application specificintegrated circuits, programmable logic arrays, and other hardwaredevices can likewise be constructed to implement the methods andfunctions described herein. Further, the methods and functions describedherein may be implemented as a device, such as a computer readablestorage medium or memory device, including instructions that whenexecuted cause a processor to perform the methods.

Areal densities of hard disc regions can be changed based on storagecapacity and reliability needs. Further adjustments can be made to theformatting of the region to fine tune achievable storage capacity andreliability values. In some cases, the formatting can include errorcorrection code strength, gap widths between the region and servo datasectors, or other characteristics.

Examples are provided herein illustrating a system for on the flyformatting for adjusting the storage capacity and reliability of aregion by modifying the areal density, error correcting code (ECC), orother characteristics of the region.

Referring to FIG. 1, certain embodiments of a system for on the flyformatting are shown and generally designated 100. Data storage device(“DSD”) 101 can optionally connect to be removable from a host device101, which can be a desktop computer, a laptop computer, a server, atelephone, a music player, another electronic device, or any combinationthereof. The DSD 101 can communicate with the host device 102 via thehardware/firmware based host interface circuit 110 that may include aconnector that allows the DSD 101 to be physically removed from the host102.

The DSD 101 can include a system processor 114 and associated memory116. The system processor 114 may be part of a system on chip (SOC). Abuffer 112 can temporarily store data during read and write operations.A preamplifier/driver circuit (“preamp”) 118 can apply write currents tothe head(s) 122 and can provide pre-amplification of read signals. Aservo control circuit 126 may use servo data from a servo sector toprovide the appropriate current to the voice coil motor 120 to positionthe head(s) 122 over disc(s) 124. In some cases, the head(s) 122 mayhave multiple reader elements. The controller 106 can communicate with aprocessor 114 to move the head(s) 122 to the desired locations on thedisc(s) 124 during execution of various pending commands or during otheroperations. Also, the DSD 101 can include a read/write (R/W) channel 106which can encode data during write operations and reconstruct user dataduring read operations.

The DSD 101 can include an adaptive track format generator (“ATFG”) 104.The ATFG 104 may be executable firmware that, when executed by thesystem processor 114, cause the R/W channel 106 to change a format of aregion of the disc 108 based on the region's characteristics to achievestorage capacity and reliability specifications. The characteristics caninclude bits per inch (“BPI”), error correcting code (“ECC”) strength,gap width between regions (“ISG”), and other characteristics (see FIGS.2 and 3). In some cases, the ECC may be low density parity check code(“LDPC”), turbo codes, convolution codes, or other error correctingcodes. Changing ECC strength may change the number of bits that need tobe stored, which may allow for less space or more space to be allottedto storing ECC. In some cases, the ATFG 104 can change the format of theregion during a manufacturing process.

Referring to FIG. 2, certain embodiments of a system for on the flyformatting are shown and generally designated 200. System 200 is anexample of system 100, in accordance with certain embodiments. System200 can have a disc storage medium 202, which can include a servo wedge204, and a region 206. The servo wedge 204 can include information thatmay be used to determine a rotational position of the disc 202. In somecases, there may be multiple servo wedges on the disc medium 202. Insome instances, there can be gaps between the servo wedge 204 the region206.

The region 206 may be a sector, track, zone, or other portion of thedisc. The region 206 can include one or more tracks, and may beshingled, non-shingled, bit patterned media, or other storagetechnology. The disc 202 can have multiple regions, and each region canbe a different size and format. In some cases, the size and format ofthe regions can be changed during manufacturing. For example, the formatof the regions may be changed during the manufacture of the disc driveafter the components of the disc drive have been assembled. In someexamples, the format of the regions may be changed when the discs aremanufactured, calibrated, or tested before the disc drive is assembled,or at other times. In some cases, the regions may be formatted during aburn-in test (i.e. components of the disc drive are exercised prior tobeing placed in service).

During operation, the ATFG can format the region 206 by changing theareal density or other characteristics of the region 206. In some cases,the ATFG may format the region 206 when the storage capacity andreliability of the region 206 are not being met. In some examples,reliability may be a measure of a likelihood of a bit error duringstorage or transmission. A level of reliability may be determined bymeasure a bit error rate (“BER”), adjacent track interference (“ATI”)margin, other parameters, or any combination thereof. In some cases,reliability may be affected by other characteristics of a DSD. Forexample, reliability may be reduced due to flaws in a recording head(e.g. too small or too big), scratches or defects on the disc storagemedium 202, and so forth.

Referring to FIG. 3, certain embodiments of a system for on the flyformatting are shown and generally designated 300. The embodiments 300are examples of systems 100 and 200, in accordance with certainembodiments. The embodiments 300 show sample regions A, B, and C,intersector gap (ISG) 324, gap after servo (GAS) 314, servo sector 316,and gap before servo (GBS) 318. The ISG 324, GAS 314, and GBS 318 may beunused storage space. Also shown are region A in a first state 302 and asecond state 303, region B in a first state 306 and a second state 307,and region C in a first state 310 and a second state 312. Each regioncan have data bits 309, tracks 326, user data storage 334, and header320. In some cases, the user data storage 334 is an amount of a region'stotal capacity designated to store user data.

Each region may have separate ECC corresponding to data in that region.For illustrative purposes, the ECC strength of each region is shownrelative to the ECC strength of other regions. For example, ECC AA 304can represent an ECC strength of the region A in the first state 302,ECC BA 308 can represent an ECC strength of the region B in the firststate 306, and ECC CA 322 can represent an ECC strength of the region Cin the first state 310. Further, ECC AB 328 can represent an ECCstrength of the region A in the second state 303, ECC BB 330 canrepresent an ECC strength of the region B in the second state 307, andECC CB 332 can represent an ECC strength of the region C in the secondstate 312. ECC AA 304 through ECC CB 332 are not intended to representabsolute values, or any type, size or location of ECC in the regions A,B, and C.

In some embodiments, region A, region B, and region C, may be multiplesectors and multiple tracks, showing one sector of each adjacent track.In some cases, region A, region B, and region C may be the same size,although in other embodiments, region A, region B, and region C may bedifferent storage types, and can be different sizes. For example, regionA 302 may be a zone, region B may be a 512 KB sector, and region C maybe a 1024 KB sector. Thus, the regions depicted in FIG. 3 are just asubset of storage area that is shown merely to provide an example offactors that can be adjusted to accommodate on the fly formatting tochange areal density.

Each region may have a predetermined or initial amount of storage space.Storage space may be configured to store user data, ECC data, headerdata, preambles, post-ambles, other data, or any combination thereof.

In some cases, the amount of storage space in a region can be adjustedby changing ISG, GAS, GBS, other parameters, or any combination thereof.When the ISG, GAS, or GBS are increased, the storage space of the regionmay decrease because less physical space is available for the region. Insome examples, the amount storage space may increase when the ISG, GAS,or GBS are decreased because more physical space on the disc isavailable for storing host or user data in the region.

Three examples are shown illustrating how adjustments made to regions ina first state can change parameters in a second state. Referring toexample 1, region A state 1 302 and region A state 2 303 are shown. Inthis example, the ATFG can increase the BPI of region A, and decreasethe relative size of the ECC AA 304 to ECC AB 328. Thus, the storagecapacity of the region A may be increased and the error correctionstrength may be decreased.

Referring to example 2, region B state A 306 and region B state B 307are shown. In this example, the ATFG can increase the BPI of region B,and decrease the relative size of the ECC BA 308 to the ECC BB 330. Thiscan cause an increase in storage capacity but a reduction in errorcorrection strength.

In some cases, changes to the storage capacity and error correctionstrength may reduce the reliability below an acceptable level. Forexample, it may be determined that the changes to BPI of a region mayincrease storage capacity, but may reduce reliability below anacceptable level. In some cases, changing gap parameters (e.g. ISG, GBS,GAS) may be changed to increase reliability by making a data storagedevice more robust to delay and jitter. The gap parameters may bechanged by formatting the region to allow more or less data to be storedin the gap widths. Since data storage takes up physical space,increasing a storage capacity of a user/host data area may reduce a sizeof one or more gaps. Conversely, reducing a storage capacity of auser/host data area may allow a width of a physical gap to increase,thus increasing ISG 306 and GAS 314 may increase the reliability ofregion B. In some cases, drive performance can increase as the size ofthe gaps is increased.

In some embodiments, the ATFG may change a pre-amble length to improvereliability by decreasing the BPI of the preamble. The pre-amble may bea portion of a region used to lock timing to read data (e.g. timingacquisition to seek sync (address) mark). If a defect occurs on thepre-amble portion of a region, remaining valid pre-amble data may beused to lock the timing to read data. The longer the remaining pre-amblelength is, the more likely the read data may be read successfully.

Referring to example 3, a case in which BPI is decreased and errorcorrection strength is increased is shown. In some situations, it may bedesirable to increase reliability if a region's BER (sometimes referredto as a signal to noise ratio) or ATI exceed threshold levels. The BERis how many erroneous bits occur in a set number of processed ortransferred bits. Bit errors may be due to hardware errors, data channelerrors, firmware or software errors, processing errors, or other errors.ATI can occur when adjacent tracks are too close; writing data to onetrack can corrupt data in an adjacent track. Further, when the ATI isabove a threshold level, a hard disc may not have enough pitch margin toresist against external shocks or vibrations.

In this example, the ATFG may determine that the reliability of region Cat state A 310 may be too low. The ATFG can reduce the BPI, and increasea corrective power of ECC CA 322 to ECC CB 332. In some cases, thecorrective power of ECC can be strengthened by allowing more parity bitsto be used by the ECC. ECCs using more parity bits may consume morestorage resources than ECC using fewer parity bits. Further, the ATFGmay reduce a size of the header 320 and increase the GBS 318 to finetune the parameters to reach a desired outcome. The size of the header320 may be increased or decreased by changing a number of header paritybits. The GBS 318 may be increased by reducing the overall storagecapacity of region C. In some cases, the GBS 318 may be increased ordecreased by changing the amount of physical space that the GBS 318occupies. In some cases, a reduction of storage capacity space on thedata storage medium due to the GBS 318 being increased may be mitigatedby adjusting other parameters, such as ECC 332, ISG (if applicable), orother parameters, to allow a system to have similar or greater overallstorage capacity.

In some cases, the some of the parameters may be individually adjusted.In some embodiments, some of the parameters may be included in a formatset. A format set can include a pre-determined combination of parametervalues. For example, format set “A” may have ECC=X, ISG=Y, header=Z,format set “B” may have ECC=X′, ISG=Y′, header=Z′, and format set “C”may have ECC=X, ISG=Y′, and header=Q″. In some examples, the format setmay be included in a look-up table, or included in firmware.

In some embodiments, the format of one or more regions may be changed onthe fly when the disc drive is outside of a factory environment, or isin service. For example, the format of one or more regions may bechanged during operation of the disc drive in a user environment (ornon-Original Equipment Manufacturer “OEM” environment).

It should be understood that the examples shown are but a few possibleconfigurations, and many other configurations exist and are too numerousto show in their entireties.

Referring to FIG. 4, a flowchart of a method for on the fly formattingis shown and generally designated 400. The method 400 is animplementation of systems 100, 200, or 300, in accordance with certainembodiments.

The method 400 can start at 402. In some embodiments, the method 400 maystart during a manufacturing process, such as a burn-in process. Themethod 400 can determine the areal density capability (“ADC”) of a datastorage medium, at 404. The ADC may be based, at least in part, on BPI,tracks per inch (“TPI”), or both. The ADC may vary from DSD to DSD,model to model, and so forth.

The method 400 may recover extra storage capacity based on the ADC, at406. In some cases, a DSD may exceed storage capacity specifications.For example, a DSD designed to store one terabyte may have in fact beenmanufactured with a storage capacity of 1.2 terabytes. The extra 200gigabytes may be used to increase reliability.

The method 400 may determine format set parameters, at 408. The formatset parameters can include gap parameters, headers, error correctioncode, and so forth. The format set parameters may vary by region. A DSDmay adjust the format set parameters to fine tune capacity andreliability characteristics. Accordingly, the method 400 may includesetting the capacity based on format set parameters and ADC, at 410.FIGS. 5, 6, 7, and 8 present embodiments which may implement the“determine format set parameters” operation of 408 and the “setcapacity” operation of 410.

Referring to FIG. 5, a flowchart of a method for on the fly formattingis shown and generally designated 500. The method 500 is animplementation of systems 100, 200, 300, or 400, in accordance withcertain embodiments. In some cases, the method 500 may be the formatdetermination and capacity setting operations of method 400.

The method 500 starts, at 502. In some cases, method 500 can includedetermining if more reliability is needed, at 504. When more reliabilityis needed, the method 500 can include determining format factors, at506. Format factors can include BPI and other parameters. The formatfactors may be implemented, at 508.

Referring to FIG. 5, a flowchart of a method for on the fly formattingis shown and generally designated 500. The method 500 is animplementation of systems 100, 200, 300, or 400, in accordance withcertain embodiments. In some cases, the method 500 may be the formatreturn operation 408.

The method 500 start, at 502. In some cases, method 500 can startinclude determining if more reliability is needed, at 504. When morereliability is needed, the method 500 can include determining formatfactors, at 506. Format factors can include BPI and other parameters.The format factors may be implemented, at 508.

The method 500 may determine format set parameters, at 510 (see FIG. 6for details). In some cases, the format set parameters may include errorcorrection code strength, gap settings, or other factors. When theformat set parameters are determined, the method 500 can format one ormore regions based on the format set parameters, at 512. The method 500can end, at 514.

Referring to FIG. 6, a flowchart of a method for on the fly formattingis shown and generally designated 600. The method 600 is animplementation of systems 100, 200, 300, 400, or 500, in accordance withcertain embodiments. In some cases, the method 600 may be the “determineformat set parameters operation” 510 shown in FIG. 5.

Extra storage capacity may be recovered to increase reliability. In someembodiments, the amount of extra storage capacity can be compared withECC codes of different correction strength to determine an optimized ECCfor an available space based on the extra storage capacity. The ECChaving the highest correction strength (and thus requiring more storageresources) that does not exceed a threshold amount of the availableextra storage capacity may be implemented in a corresponding region.

In some embodiments, there may be multiple extra storage capacitythresholds for determining an ECC that can maximize a level of errorcorrection for an available storage space. For example, a system mayhave three available extra storage capacity thresholds: high, medium,and low, each having a different corresponding optimal ECC based onavailable storage capacity.

The method 600 can start, at 602. The method 600 can determine if theavailable extra storage capacity is greater than the high thresholdvalue, at 604. When the available extra storage capacity is greater thanthe high threshold value, the method 600 can include selecting an ECCwith a high level of error protection, at 606, that requires a firstamount of storage capacity. The method 600 may then adjust other formatset parameters, at 616.

When the available extra storage capacity is less than the highthreshold value, the method 600 can include determining if the availableextra storage capacity is greater than the medium threshold value, at608. When the available extra storage capacity is greater than a mediumthreshold but less than the high threshold, the method 600 can includeselecting an ECC corresponding to a medium level of error protection, at610, that requires a second amount of storage capacity less than thefirst amount of storage capacity for the high level of error protection.The method 600 may then adjust other parameters, at 616.

When the available extra storage capacity is not greater than the mediumthreshold, the method 600 can include determining if the available extrastorage capacity is greater than the low threshold, at 612. When theavailable capacity is greater than the low threshold but less than themedium threshold value, the method 600 can include selecting an ECC witha lower level of error protection, at 614, that requires a third amountof storage capacity less than the second amount of storage capacity forthe medium level of error protection. If the storage capacity is lessthan the lower threshold, the ECC may not be changed. The method 600 maythen adjust other parameters, at 616 see FIG. 7 for details). The numberof thresholds and selectable ECC variations can be less or more than theexample provided that shows three. In some embodiments, the selectableECC is a selectable LDPC.

In some examples, the number of thresholds and values of the thresholdsmay vary. In some cases the threshold values and the number ofthresholds may vary for each DSD, by product model, and so forth. Insome cases, the threshold values may be based, at least in part, oncircuit functions (SOC, ASIC, etc.), circuit designs (e.g. channelcircuit designs), firmware code, other factors, or any combinationthereof. In some embodiments, other methods may be used to determine theformat set parameters. For example, iterative calculations based on agap parameter, header, or other parameter may be used to determine theformat set parameters.

The method 600 can determine if a number of logical block addresses(LBAs) mapped to the region exceeds a threshold level, at 618. In someexamples, a threshold level may be an available storage capacity of theregion. In some cases, when reliability is increased, available storagecapacity may be reduced. When the available storage capacity is toosmall to accommodate the mapped LBAs, the number of LBAs mapped to theregion may be reduced. The method 600 can determine which LBAs may beremapped, and to what locations, at 620. In some embodiments, firmwareor software executed by a processor or controller can determine a newLBA mapping.

The method 600 may end, at 622, which may then allow a region to beformatted or re-formatted based on the settings of the parameters.

In some embodiments, the method 600 may be independent of the method500. The method 600 may include more or fewer operations. In someembodiments, the method 600 may select the others parameters beforeselecting the ECC.

Referring to FIG. 7, a flowchart of a method for on the fly formattingis shown and generally designated 700. The method 700 includesimplementations of systems 100, 200, 300, 400, 500, or 600, inaccordance with certain embodiments. In some cases, the method 600 maybe an example of operation 616 of FIG. 6.

When new values for ECC are selected, values for ISG, GBS, GAS, orheader may be calculated. In some cases, PLO (phase-locked oscillatorjitter), pre-amble, post-amble, pre-amp settings or other settings canbe calculated.

The method 700 can include determining a value for the PLO, at 704, GBS,at 706, GAS, at 708, and ISG, at 710. The method 700 can determine avalue for the header, at 712, pre-amble, at 714, post-amble, 716, andpre-amp settings, at 718.

Once the parameter values have been determined, the method 700 caninclude selecting a format set based on the parameter values, at 720. Insome embodiments, the method 700 can check to see if the selected formatset is a good match, or if another format set may be selected. In someexamples, format sets may be stored in a memory, such as a read-onlymemory. In some cases, format sets may be retrieved from locationsoutside of the DSD. For example, a DSD may download the format sets froma server via a network connection. The method 700 can end, at 722.

Some parameters may have a greater impact on a region's reliability andcapacity than other parameters. For example, adjustments to the PLO mayhave a greater impact on the reliability and capacity than doadjustments to other parameters, such as the ISG, post-amble, or pre-ampdelay. Therefore, it may be desirable to determine values for parametershaving the highest impact. Also, a format set may be chosen based firston the parameters having the highest impact, and then on otherparameters. The impact a parameter may have on reliability or capacitycan vary, and parameter values can be determined in any order,irrespective of relative impact level.

In some examples, the method 700 may calculate format parameter valuesin parallel. The method 700 shown in FIG. 7 is one of variousembodiments that are possible, as the order and inclusion of whichparameters to adjust can be changed.

Referring to FIG. 8, a flowchart of a method for on the fly formattingis shown and generally designated 800. The method 800 is animplementation of systems 100, 200, 300, or 400, in accordance withcertain embodiments.

The method 800 can start at 802. In some embodiments, the method 800 maystart during a manufacturing process, such as a burn-in process, and caninclude determining if more storage capacity is needed, at 804. Whenmore storage capacity is needed, the method 800 can include determiningformat factors, at 806. In some examples, the format factors can includeBPI values. The format factors may be adjusted to achieve a desiredlevel of reliability, storage capacity, other parameter(s), or anycombination thereof. For example, the storage capacity may be increasedby increasing the BPI. The format factors may be applied, at 808. Whenno additional storage capacity is needed, the method 800 can end, at814.

The method 800 may determine format set parameters, at 810. In somecases, the format set parameters may include error correction codestrength, gap settings, or other factors. When the format set parametersare determined, the method 800 can format the one or more regions basedon the format set parameters, at 812. The method 800 can end, at 814.

In some embodiments, additional operations may be added, some operationsmay be removed, or the order of operation may change. In some cases, anATFG may be an application specific integrated circuit, a system onchip, or other circuit. An ATFG may be integrated with read/writechannel circuit(s) or may be an independent circuit.

The illustrations, examples, and embodiments described herein areintended to provide a general understanding of the structure of variousembodiments. The illustrations are not intended to serve as a completedescription of all of the elements and features of apparatus and systemsthat utilize the structures or methods described herein. Many otherembodiments may be apparent to those of skill in the art upon reviewingthe disclosure. Other embodiments may be utilized and derived from thedisclosure, such that structural and logical substitutions and changesmay be made without departing from the scope of the disclosure.Moreover, although specific embodiments have been illustrated anddescribed herein, it should be appreciated that any subsequentarrangement designed to achieve the same or similar purpose may besubstituted for the specific embodiments shown.

This disclosure is intended to cover any and all subsequent adaptationsor variations of various embodiments. Combinations of the aboveexamples, and other embodiments not specifically described herein, willbe apparent to those of skill in the art upon reviewing the description.Additionally, the illustrations are merely representational and may notbe drawn to scale. Certain proportions within the illustrations may beexaggerated, while other proportions may be reduced. Accordingly, thedisclosure and the figures are to be regarded as illustrative and notrestrictive.

What is claimed is:
 1. An apparatus comprising: a channel circuitconfigured to encode data during a write operation to a data storagemedium and reconstruct user data during a read operation from the datastorage medium; the channel circuit configured to implement a first lowdensity parity check code as an error correcting code; and the channelcircuit configured to implement a second low density parity check codebased on a change to a density of a region of the data storage medium.2. The apparatus of claim 1 further comprising a modification circuitconfigured to modify the density based on one or more characteristics ofa data storage device including the apparatus.
 3. The apparatus of claim2 further comprising the one or more characteristics includes anavailable storage capacity of the region.
 4. The apparatus of claim 1further comprising: the data storage medium having a servo sector; and acontrol circuit configured to modify a gap between an end of the servosector and a beginning of the region.
 5. The apparatus of claim 4further comprising: the control circuit further configured to change asize of error correction code data associated with the region based on amodification of the gap.
 6. The apparatus of claim 1 further comprising:a control circuit configured to change a size of error correction codedata associated with the region based on an amount of available storagecapacity associated with the region.
 7. A device comprising: a controlcircuit configured to modify a format of a region of a data storagemedium on the fly during operation of a data storage device controllingthe data storage medium, including changing error correction code (ECC)data of the region from a first ECC scheme employing a first number ofparity bits to a second ECC scheme employing a second number of paritybits different from the first number of parity bits.
 8. The device ofclaim 7 further comprising the control circuit configured to change thesize of the error correction code data in response to a determination ofa reliability value associated with the region.
 9. The device of claim 7further comprising the control circuit configured to change the size ofthe error correction code data in response to a determination of a needfor a change in data storage capacity.
 10. The device of claim 7 furthercomprising: a channel circuit configured to encode data during writeoperations to the data storage medium and reconstruct data during readoperations from the data storage medium; the channel circuit configuredto implement a first low density parity check code as the first ECCscheme having a first size of data on the data storage medium; thechannel circuit configured to implement a second low density paritycheck code as the second ECC scheme having a second size of data on thedata storage medium; and the first size is different than the secondsize.
 11. The device of claim 7 further comprising: the data storagemedium having a servo sector; and the control circuit configured tomodify a gap between an end of the servo sector and a beginning of theregion.
 12. The device of claim 11 further comprising: the controlcircuit further configured to change the size of error correction codedata associated with the region based on a modification of the gap. 13.A circuit comprising: a controller configured to perform on-the-flyformatting of a data storage track including selectively changing a sizeof error correction data stored on the data storage track based onswitching from implementing a first error correction code (ECC) using afirst number of parity bits to implementing a second ECC using a secondnumber of parity bits.
 14. The circuit of claim 13 further comprisingthe controller configured to modify an areal density of a region of amagnetic data storage medium based on a reliability value, duringoperation of the data storage medium.
 15. The circuit of claim 14further comprising: a memory including multiple format sets wherein eachof the format sets includes a pre-determined combination of parametervalues, and the parameter values include at least one of a first gapwidth between the region and an end of a servo sector, a second gapwidth between the region and a beginning of the servo sector, a thirdgap width between the region and another region, a low density paritycheck code, a header, a pre-amble, a post-amble, and phase-lockedoscillator setting; and the controller configured to selectivelyimplement one of the multiple format sets based on the reliabilityvalue.
 16. The circuit of claim 13 further comprising: the controllerfurther configured to determine if an available storage capacity isgreater than a first threshold value, and implement the first ECC forthe data storage track when the available storage capacity is greaterthan the threshold value, and implement the second ECC when theavailable storage capacity is less than the first threshold value. 17.The circuit of claim 16 further comprising: the controller furtherconfigured to determine if the available storage capacity is greaterthan a second threshold value, and implement the second ECC when theavailable storage capacity is greater than the second threshold value.18. The circuit of claim 13 further comprising: the controllerconfigured to change the size of the error correction data in responseto a determination of a reliability value associated with the region.19. The circuit of claim 13 further comprising: the controllerconfigured to change the size of the error correction data in responseto a determination of a need for a change in data storage capacity. 20.The circuit of claim 13 further comprising: a channel circuit configuredto encode data during a write operation to the data storage track andreconstruct user data during a read operation from the data storagetrack; the channel circuit configured to implement a first low densityparity check code as the first ECC; and the channel circuit configuredto implement a second low density parity check code as the second ECCbased on a change to a size of the error correction data.